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发明名称
PROBE CARD TESTER
摘要
申请公布号
KR0180610(B1)
申请公布日期
1999.04.01
申请号
KR19950046296
申请日期
1995.12.04
申请人
INTERNATIONAL TECHNOLOGY CO., LTD.
发明人
LEE, SUK-HAENG
分类号
G01R1/06;(IPC1-7):G01R1/06
主分类号
G01R1/06
代理机构
代理人
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地址
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