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经营范围
发明名称
DEVICE FOR TESTING SHORT CIRCUIT AND OPENING CONDITION OF RELAY
摘要
申请公布号
KR0179185(B1)
申请公布日期
1999.04.01
申请号
KR19950060868
申请日期
1995.12.28
申请人
DAEWOO ELECTRONICS CO.,LTD
发明人
分类号
G01R31/327;(IPC1-7):G01R31/327
主分类号
G01R31/327
代理机构
代理人
主权项
地址
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