发明名称 Halbleitersensor mit einem Grundkörper und wenigstens einem Verformungskörper
摘要 The invention relates to a semiconductor detector with a base structure (4) and at least one deformable body (8), wherein the deformable body (8) consists of a semiconductor substrate which is doped with a dopant displaying a first type of conductivity. Piezo resistors (14) doped with a dopant displaying an opposite type of conductivity are located in the deformable body (8). The deformable body (8) is in contact with a medium in at least one partial area. The inventive semiconductor detector is characterized in that the partial area has a dopant concentration that is lower than the dopant concentration in the area located between said partial area and the piezo resistor (14).
申请公布号 DE19741428(A1) 申请公布日期 1999.04.01
申请号 DE19971041428 申请日期 1997.09.19
申请人 SIEMENS AG, 80333 MUENCHEN, DE 发明人 BEVER, THOMAS, DR., 81739 MUENCHEN, DE;SCHMITT, STEPHAN, 81541 MUENCHEN, DE;EHRLER, GUENTER, 83607 HOLZKIRCHEN, DE
分类号 G01L9/00;G01L9/04;G01P15/08;G01P15/12;(IPC1-7):H01L47/00;G01N27/02;H01L29/84 主分类号 G01L9/00
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