| 摘要 |
<p>A technique to produce a device (40) for generating an electric field is disclosed. This electric field may be customized to direct movement of charged particles in a predetermined manner. Moreover, this device (40) is readily installed and removed from a charged particle analyzer to facilitate interchange with other devices capable of generating electric fields with different characteristics. The device (40) may be provided by etching an electrically conductive layer clad to a flexible dielectric substrate (52) to define a predetermined conductive pattern (54a). This pattern (54a) is then oriented relative to a charged particle pathway (P) and an electric potential applied to generate the desired electric field.</p> |
