发明名称 MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE
摘要 On top of a substrate having already-completed circuit elements and wiring, etc., insulation under layer 4, Pt layer 3 for bottom electrode, dielectric film 2 and Pt layer 1 for top electrode are shaped. And then, form top electrode 1a, capacitance insulation film 2a and bottom electrode 3a by etching Pt layer 1 for top electrode or Pt layer 3 for bottom electrode, using an etching gas containing S component while composing Pt and S compound; or first compose Pt and S compound, and then etch the compound.
申请公布号 KR0171060(B1) 申请公布日期 1999.03.30
申请号 KR19940036615 申请日期 1994.12.24
申请人 MATSUSHITA ELECTRONICS CORP. 发明人 MATSUMOTO, SHOJI;NIKOU, HIDEO;NAKAGAWA, SATOSHI
分类号 H01L21/02;H01L21/3213;(IPC1-7):H01L21/30 主分类号 H01L21/02
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