发明名称 METHOD AND SYSTEM FOR POLISHING SEMICONDUCTOR WAFER
摘要 <p>PROBLEM TO BE SOLVED: To provide a system for polishing a semiconductor wafer with stabilized polishing characteristics, without causing polishing flaws on the surface of the semiconductor wafer. SOLUTION: This system for polishing a semiconductor wafer comprises a slurry supply tank 1 for storing polishing slurry 2A, a slurry feed pump 3 for pressure feeding the polishing slurry 2A to a slurry delivery port 5 through a slurry supply piping 4, a unit 20 for transmitting ultrasonic waves to the slurry supply piping 4, a polishing cloth 7 for applying a polishing slurry 2B delivered from the slurry delivery port 5, a water carrier 8 for holding a semiconductor water 9, while bringing the surface thereof into pressure contact with the surface of the polishing cloth 7 coated with the polishing slurry 2B, and moving the semiconductor wafer 9 relative to the polishing cloth 7, and piping 11 for discharging liquid slurry from the surface of the polishing cloth 7.</p>
申请公布号 JPH1187284(A) 申请公布日期 1999.03.30
申请号 JP19970239496 申请日期 1997.09.04
申请人 MATSUSHITA ELECTRON CORP 发明人 HASHIMOTO SHIN;MIYOSHI YUICHI
分类号 B24B57/04;B24B1/04;B24B37/00;B24B57/02;H01L21/304;(IPC1-7):H01L21/304 主分类号 B24B57/04
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