发明名称 |
SIGNAL CONVERTER, SEMICONDUCTOR INTEGRATED CIRCUIT, EQUIPMENT SERVICEABILITY RATIO MONITOR AND MEASURING METHOD THEREOF |
摘要 |
<p>PROBLEM TO BE SOLVED: To eliminate the need for interfaces, even in the case of different signal specifications of a production facilities and easily measure and record the working condition of the facilities. SOLUTION: A serviceability ratio monitor for measuring and recording the working condition of manufacturing facilities 71 -7n has a signal converter circuit 12. A facility signal converter circuit block 22 converts facilities signals outputted from the facilities 71 -7n , based on the program of a conversion mode according to the facility signals among conversion modes stored in a processing program storage 13, a CPU 24 performs calculations to convert them into serviceability ratio signals to be common signals capable of measuring and recording the serviceability ratio of the monitor.</p> |
申请公布号 |
JPH1187455(A) |
申请公布日期 |
1999.03.30 |
申请号 |
JP19970245762 |
申请日期 |
1997.09.10 |
申请人 |
HITACHI HOKKAI SEMICONDUCTOR LTD |
发明人 |
KIYOFUJI ASAKO;KANEKO MASARU;HIGUCHI NAOHIRO;ITAGAKI TAKATOSHI |
分类号 |
B23Q41/08;G05B19/05;G05B19/418;G06F11/34;H01L21/02;H01L21/66;(IPC1-7):H01L21/66 |
主分类号 |
B23Q41/08 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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