发明名称 TEST CONTROL METHOD FOR EXCHANGE
摘要 <p>PROBLEM TO BE SOLVED: To efficiently execute test without generating service decline in the test control method of an exchange provided with plural test cell generators. SOLUTION: In this method, the plural test cell generators 37 are provided in the exchange having a central processing unit 31 and a channel controller 32 including a switch part 35 and a channel correspondence part 36, etc., the load value of the central processing unit 31 is measured and the using number of the test cell generators 37 is calculated so as not to make the measured load value exceed a control load value by a periodical test execution part 34 or the like. Also, the method includes the process for testing in parallel plural routes for looping back test cells at the specified loop-back part of the switch part 35 and the channel correspondence part 36 by simultaneously using the calculated using number of the test cell generators 37.</p>
申请公布号 JPH1188333(A) 申请公布日期 1999.03.30
申请号 JP19970236714 申请日期 1997.09.02
申请人 FUJITSU LTD 发明人 AKAGAWA TSUKASA;MATSUURA AKIKIMI;TANGIKU YUUKO;AKITA KENICHI;OGAWA KENJI;TSUKUSHI KENGO
分类号 H04M3/26;H04L12/26;H04L12/70;H04L29/14;H04Q3/00;(IPC1-7):H04L12/28 主分类号 H04M3/26
代理机构 代理人
主权项
地址