发明名称 |
Measuring short electron bunch lengths using coherent smith-purcell radiation |
摘要 |
A method is provided for directly determining the length of sub-picosecond electron bunches. A metallic grating is formed with a groove spacing greater than a length expected for the electron bunches. The electron bunches are passed over the metallic grating to generate coherent and incoherent Smith-Purcell radiation. The angular distribution of the coherent Smith-Purcell radiation is then mapped to directly deduce the length of the electron bunches.
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申请公布号 |
US5889797(A) |
申请公布日期 |
1999.03.30 |
申请号 |
US19970915240 |
申请日期 |
1997.08.20 |
申请人 |
THE REGENTS OF THE UNIVERSITY OF CALIFORNIA |
发明人 |
NGUYEN, DINH C. |
分类号 |
H05H7/04;(IPC1-7):H01S3/00 |
主分类号 |
H05H7/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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