发明名称 Measuring short electron bunch lengths using coherent smith-purcell radiation
摘要 A method is provided for directly determining the length of sub-picosecond electron bunches. A metallic grating is formed with a groove spacing greater than a length expected for the electron bunches. The electron bunches are passed over the metallic grating to generate coherent and incoherent Smith-Purcell radiation. The angular distribution of the coherent Smith-Purcell radiation is then mapped to directly deduce the length of the electron bunches.
申请公布号 US5889797(A) 申请公布日期 1999.03.30
申请号 US19970915240 申请日期 1997.08.20
申请人 THE REGENTS OF THE UNIVERSITY OF CALIFORNIA 发明人 NGUYEN, DINH C.
分类号 H05H7/04;(IPC1-7):H01S3/00 主分类号 H05H7/04
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