发明名称 MANUFACTURING SEMICONDUCTOR DEVICE AND METHOD OF FORMING WIRING
摘要 PROBLEM TO BE SOLVED: To provide a method of manufacturing a semiconductor device which can easily form good electrical connections between electrodes of mutually different layers and wirings or between wirings. SOLUTION: This manufacturing method has an element isolation regions 51 formed on a main plane of a semiconductor substrate 50, forming gate electrodes 53 and source-drain electrodes 56, forming an insulating nitride film 57 on the main plane of the substrate 50, forming a layer insulation film 58 having connection holes H, converting the nitride film 57 at the bottoms of the connection holes H to a conductive nitride film 61 having a coupling energy higher than that of the insulating nitride, and forming a wiring 62 to be connected to the source-drain electrodes 56 through the conductive nitride film 61.
申请公布号 JPH1187504(A) 申请公布日期 1999.03.30
申请号 JP19970248160 申请日期 1997.09.12
申请人 TOSHIBA CORP 发明人 NISHIYAMA AKIRA
分类号 H01L21/285;H01L21/768;H01L21/8234;H01L21/8242;H01L21/8244;H01L27/06;H01L27/108;H01L27/11 主分类号 H01L21/285
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