发明名称 SEMICONDUCTOR DEVICE
摘要 <p>PROBLEM TO BE SOLVED: To enable a solder ball to crack less by a method wherein the connections of the wiring terminal electrode of a ball grid array board to the solder ball is made flat. SOLUTION: In a semiconductor device, the wiring terminal electrode 5 of a flip-chip type ball grid array(BGA) board 2 formed of a plastic wiring board manufactured through a build-up method is extended up to the flat surface of the board 2, the extended part 5A of the wiring terminal electrode 5 is electrically connected to the outer electrode 4 of a semiconductor chip l through a solder ball 3, and a gap between the BGA board 2 and the semiconductor chip 1 is sealed up with a sealing resin 6. Therefore, no voids are produced at the connections of the wiring terminal electrode 5 to the solder ball 3, so that the solder ball 3 is less cracked. By this arrangement connections between the wiring terminal electrode 5 of the BGA board 2 and the outer electrode 4 of the semiconductor chip 1 can be restrained from deteriorating in electrical connection life.</p>
申请公布号 JPH1187556(A) 申请公布日期 1999.03.30
申请号 JP19970243063 申请日期 1997.09.08
申请人 HITACHI LTD 发明人 YAMAGUCHI EIJI;YOSHIDA IKUO;HAYASHIDA TETSUYA
分类号 H01L21/60;H01L23/12;(IPC1-7):H01L23/12 主分类号 H01L21/60
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