发明名称 MANUFACTURE OF TRANSISTOR
摘要 <p>PROBLEM TO BE SOLVED: To provide a method for manufacturing a transistor for improving the operating speed of a circuit by preventing decrease in characteristics of a short-channel transistor having a long channel by channel ion implantation for improving the characteristics of the transistor, reducing the difference of threshold voltages in a chip to obtain satisfactory circuit characteristics, moreover reducing the size of a minimum transistor usable for improving a short- channel effect, and increasing the saturated current of the transistor. SOLUTION: A channel ion implantation for improving the characteristics of a short-channel transistor is executed to only an active region 2 for forming the transistor with a mask layer 5 used as a mask. Thereafter, ion implantation for optimizing threshold of both the active regions 2, 3 for forming the short- channel transistor and a long-channel transistor is executed.</p>
申请公布号 JPH1187525(A) 申请公布日期 1999.03.30
申请号 JP19980069750 申请日期 1998.03.19
申请人 SAMSUNG ELECTRON CO LTD 发明人 LEE SOO-CHEOL;RI TAISEI
分类号 H01L21/8234;H01L27/08;H01L27/088;(IPC1-7):H01L21/823 主分类号 H01L21/8234
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