发明名称 WAVELENGTH STANDARD FOR EXCIMER LASER
摘要 PROBLEM TO BE SOLVED: To calibrate a wavelength meter, by roughly determining the wavelength of an ArF laser, by tuning the laser to an arbitrary absorption line of gas, and by fine-tuning the laser to an absorption line near a final wavelength. SOLUTION: First, the wavelength of an ArF laser 103 is roughly determined, the laser 103 emits a laser beam A, and the laser beam A enters a wavelength detection system 105. The system 105 directs A1 that is one part of the laser beam A to a photoelectric detector 120 by using a splitter 118 and a mirror 119. An intensity level outputted from the photoelectric detector 120 is detected by a processor 134, an operation for controlling a wavelength adjuster 136 is executed, and the laser beam A is tuned to an arbitrary absorption line of gas. Furthermore, switches 120 and 130 are switched, the photoelectric detector 130 is connected to the processor 134, and the laser beam A is fine-tuned to the absorption line near a final wavelength.
申请公布号 JPH1187829(A) 申请公布日期 1999.03.30
申请号 JP19980199387 申请日期 1998.07.15
申请人 CYMER INC 发明人 DAS PALASH P;SANDSTROM RICHARD L;FOMENKOV IGOR
分类号 G01M11/00;G01J3/02;G01J3/06;G01J9/00;G03F7/20;H01S3/00;H01S3/03;H01S3/034;H01S3/13;H01S3/134;H01S3/137;H01S3/139;H01S3/225;(IPC1-7):H01S3/137 主分类号 G01M11/00
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