发明名称 MANUFACTURE OF SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To form an insulating film having a high capacity value, by forming a metal nitride thin film of titanium nitride or the like in a nitride plasma processing using ammonia or the like, in a plasma processing having a shower electrode using inert gas made of at least high purity titanium or the like in the case of conducting a chemical vapor deposition. SOLUTION: A titanium nitride film 3A of a plate electrode is formed on a tantalum oxide film 11A by using a plasma chemical vapor deposition unit having a shower electrode of high purity titanium metal. Ammonia gas is introduced, a high frequency power source voltage is applied to generate a plasma to form a titanium nitride film. The ammonia gas is decomposed by generating the plasma, radical NH<+> group is generated, the high purity titanium metal of the shower electrode is sputtered by radical NH<-> group, high purity titanium is generated in the plasma, and reacted with the ammonia gas to form a thin film titanium nitride film. An insulating film for obtaining a high capacity value can be formed by using the tantalum oxide film.
申请公布号 JPH1187648(A) 申请公布日期 1999.03.30
申请号 JP19970239975 申请日期 1997.09.04
申请人 NEC CORP 发明人 KAMIYAMA SATOSHI
分类号 C23C16/50;C23C14/34;H01L21/285;H01L21/822;H01L21/8242;H01L27/04;H01L27/108 主分类号 C23C16/50
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