发明名称 Process for producing heavily doped silicon
摘要 <p>An element X whose ionic radius is larger than Si and an element Y whose ionic radius is smaller than Si are added to an Si crystal growing atmosphere at an atomic ratio of X:Y=1:(1+ alpha ) or X:Y=(1+ alpha ):1 with the proviso of alpha being a value of 1-5. When Si is double-doped with the elements X and Y, number of carriers is increased up to 10&lt;20&gt;-10&lt;22&gt;/cm&lt;3&gt;. The double-doping may be adaptable to any of a pull method, an epitaxy method or a selective diffusion method. The double-doping remarkably increases number of carriers, so as to produce metallic Si which can be useful itself as a wiring material due to its low resistivity. &lt;IMAGE&gt;</p>
申请公布号 EP0903429(A2) 申请公布日期 1999.03.24
申请号 EP19980115709 申请日期 1998.08.20
申请人 JAPAN SCIENCE AND TECHNOLOGY CORPORATION 发明人 YOSHIDA, HIROSHI
分类号 C30B29/06;C30B15/00;C30B23/02;C30B25/02;C30B31/00;H01L21/02;H01L21/203;H01L21/208;H01L21/28;H01L21/3205;H01L23/52;H01L29/167;(IPC1-7):C30B29/02 主分类号 C30B29/06
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