发明名称 |
Process for producing heavily doped silicon |
摘要 |
<p>An element X whose ionic radius is larger than Si and an element Y whose ionic radius is smaller than Si are added to an Si crystal growing atmosphere at an atomic ratio of X:Y=1:(1+ alpha ) or X:Y=(1+ alpha ):1 with the proviso of alpha being a value of 1-5. When Si is double-doped with the elements X and Y, number of carriers is increased up to 10<20>-10<22>/cm<3>. The double-doping may be adaptable to any of a pull method, an epitaxy method or a selective diffusion method. The double-doping remarkably increases number of carriers, so as to produce metallic Si which can be useful itself as a wiring material due to its low resistivity. <IMAGE></p> |
申请公布号 |
EP0903429(A2) |
申请公布日期 |
1999.03.24 |
申请号 |
EP19980115709 |
申请日期 |
1998.08.20 |
申请人 |
JAPAN SCIENCE AND TECHNOLOGY CORPORATION |
发明人 |
YOSHIDA, HIROSHI |
分类号 |
C30B29/06;C30B15/00;C30B23/02;C30B25/02;C30B31/00;H01L21/02;H01L21/203;H01L21/208;H01L21/28;H01L21/3205;H01L23/52;H01L29/167;(IPC1-7):C30B29/02 |
主分类号 |
C30B29/06 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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