发明名称 |
Thin film type monolithic semiconductor device |
摘要 |
A monolithic type active matrix semiconductor device comprises a substrate having an insulating surface, a first plurality of thin film transistors formed on the substrate, each having a first channel region comprising an amorphous silicon semiconductor film, and a second plurality of thin film transistors, each having a second channel region comprising a crystalline semiconductor film. The crystalline semiconductor film of the second plurality of thin film transistors has a substantially single crystalline structure (mono-domain structure) and is doped with a recombination center neutralizer at a concentration of 1x1016 to 1x1020 atoms/cm3. The crystalline semiconductor film of the second plurality of thin film transistors contains a catalyst element which is capable of promoting crystallization of silicon.
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申请公布号 |
US5886366(A) |
申请公布日期 |
1999.03.23 |
申请号 |
US19970865047 |
申请日期 |
1997.05.29 |
申请人 |
SEMICONDUCTOR ENERGY LABORATORY CO., LTD. |
发明人 |
YAMAZAKI, SHUNPEI;TERAMOTO, SATOSHI |
分类号 |
G02F1/136;G02F1/1362;G02F1/1368;H01L21/20;H01L21/336;H01L21/77;H01L21/84;H01L27/12;H01L29/786;(IPC1-7):H01L31/036;H01L29/04 |
主分类号 |
G02F1/136 |
代理机构 |
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代理人 |
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地址 |
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