发明名称 Polishing fluid composition and polishing method
摘要 The present invention provides a polishing fluid composition which can effectively polish a surface of a semiconductor silicon wafer or a surface of a film comprising silicon to be formed on silicon wafers with a markedly reduced amount of colloidal silica to be used as abrasives, or a polishing fluid composition which is particularly useful for a polishing step after removal of an oxide layer in a two-step polishing method. The former polishing fluid composition comprises an alkaline suspension which contains a water-soluble silicic acid component, colloidal silica and an alkaline component, and which has a pH value of 8.5 to 13. Meanwhile, the latter polishing fluid composition comprises an alkaline solution which contains a water-soluble silicic acid component and an alkaline component, and which has a pH value of 8.5 to 13; and is substantially free of abrasive particles.
申请公布号 US5885334(A) 申请公布日期 1999.03.23
申请号 US19970857366 申请日期 1997.05.15
申请人 KABUSHIKI KAISHA KOBE SEIKO SHO 发明人 SUZUKI, TETSUO;HARA, YOSHIHIRO
分类号 C09G1/02;C09K3/14;(IPC1-7):C09K13/04 主分类号 C09G1/02
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