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发明名称
TEST SOCKET OF SEMICONDUCTOR DEVICE
摘要
申请公布号
KR0136813(Y1)
申请公布日期
1999.03.20
申请号
KR19950014413U
申请日期
1995.06.23
申请人
HYUNDAI MICRO ELECTRONICS CO.,LTD.
发明人
KIM, KYUNG-RYUL
分类号
H01L21/66;(IPC1-7):H01L21/66
主分类号
H01L21/66
代理机构
代理人
主权项
地址
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