Circuit device to prepare analog signals for a boundary scan test procedure

摘要

The circuit has a Schmitt trigger (3) receiving the analogue signals provided by an external or internal terminal (1) of a tested IC (2), the Schmitt trigger output coupled to a boundary-cell input structure (4, 6, 7). Pref. the Schmitt trigger is activated and de-activated by a control signal supplied to a control terminal (5), its output coupled to a standard boundary-cell (4) with a boundary scan input (6) and a boundary-scan output (7).