| 摘要 |
<p>PROBLEM TO BE SOLVED: To correct the variation of the detection reference of a low voltage. SOLUTION: At the time of shipping one chip microcomputer, selection data for correcting the size of a transistor constituting one voltage division side of a second resistance means are written in the specific address of a flash memory 15 by using each sample or lot as a unit. Thus, switch circuits 14-1-14-n can be selectively opened and closed, and the variation of the detection reference of a low voltage detecting circuit can be corrected.</p> |
