发明名称 |
SEMICONDUCTOR MANUFACTURE AND MANUFACTURING DEVICE THEREFOR |
摘要 |
PROBLEM TO BE SOLVED: To produce a GaN semiconductor crystal having few defects. SOLUTION: An H atom layer 12 for terminating dangling bonds on the major surface of a wafer 11 is formed by dipping the wafer 11, of which the face orientation is (111) surface and which is made of Si into hydrofluoric acid as a pre-processing of the wafer. After that the wafer is loaded into a high vacuum reaction vessel of an MBE device, and a buffer layer 13 made of GaSe which is a Van der Waals crystal body is grown on the H-atom layer 12 of the loaded wafer 12 by applying a Ga molecular beam and an Se molecular beam. Next, a semiconductor layer 14 made of GaN is grown on the buffer layer 13 of the wafer 11, by stopping the Se beam application and supplying activated N2 gas using high-frequency or electron cyclotron resonance in stead. |
申请公布号 |
JPH1174199(A) |
申请公布日期 |
1999.03.16 |
申请号 |
JP19980162057 |
申请日期 |
1998.06.10 |
申请人 |
MATSUSHITA ELECTRIC IND CO LTD |
发明人 |
NISHIKAWA KOJI;KITAHATA MAKOTO;SASAI YOICHI |
分类号 |
C30B29/38;H01L21/203;H01L21/205;H01L33/12;H01L33/16;H01L33/32;H01L33/34;H01S5/00;H01S5/323 |
主分类号 |
C30B29/38 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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