发明名称 MANUFACTURE OF SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To remove a photoresist in a short time under mild conditions, without corroding wiring materials or the like by a method wherein an inorganic substrate is cleaned with a cleaning solution which contains an oxidizing agent when photoresist is removed, and then to remove the photoresist by a removing solution. SOLUTION: In a photoresist-removing process, a photoresist is cleaned with a cleaning solution which contains an oxidizing agent, and then the photoresist is removed. It is most preferable that hydrogen peroxide be used as an oxidizing agent. An oxidizing agent to be used is varied in concentration according to its type, but generally 0.1 to 60 wt.% oxidizing agent is to be contained in a cleaning solution. It is preferable that phosphonic acid chelate be used, especially 1, 2-propanediamine tetramethylene phosphonic acid.
申请公布号 JPH1174180(A) 申请公布日期 1999.03.16
申请号 JP19970234609 申请日期 1997.08.29
申请人 MITSUBISHI GAS CHEM CO INC 发明人 MARUYAMA TAKEHITO;ABE HISAOKI;AOYAMA TETSUO
分类号 G03F7/42;H01L21/027;(IPC1-7):H01L21/027 主分类号 G03F7/42
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