发明名称 |
Pattern data compression and decompression for semiconductor test system |
摘要 |
A compression and decompression apparatus to be used for transferring test pattern data from a storage device of a host computer to a pattern memory in a semiconductor test system for testing a semiconductor device to decrease the time required for the data transfer. The compression and decompression apparatus includes: a compression means for classifying vector data in the test pattern data into a first group to be compressed to a short code and a second group not to be compressed, and for producing a look-up table showing relationship between the short code and the vector data in the first group; a compressed test pattern file storing compressed test pattern including the short code, data vector in the second group and the look-up table; and a hardware decompression circuit provided in the semiconductor test system or proximity thereto for decompressing the compressed test pattern based on the short code and the relationship shown in the look-up table and for sending decompressed test pattern to the pattern memory in the semiconductor test system. |
申请公布号 |
US5883906(A) |
申请公布日期 |
1999.03.16 |
申请号 |
US19970911929 |
申请日期 |
1997.08.15 |
申请人 |
ADVANTEST CORP. |
发明人 |
TURNQUIST, JAMES ALAN;CHEN, LEON LEE |
分类号 |
G01R31/319;(IPC1-7):G01R31/28 |
主分类号 |
G01R31/319 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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