发明名称 METHOD AND APPARATUS FOR FLUORESCENT X-RAY ANALYSIS
摘要 <p>PROBLEM TO BE SOLVED: To provide a method and an apparatus, for a fluorescent X-ray analysis, in which a plurality of measuring points corresponding to the shape of a sample can be set simply and in a short time in the fluorescent X-ray analysis in which the intensity distribution of fluorescent X-ray generated from the sample is measured. SOLUTION: Regarding a sample base 2 to which a sample 1 is fixed, driving- system coordinates which are composed of X-Y coordinates which indicate a movement amount in two directions at right angles inside a horizontal plane from a position OT as a reference and of Z-coordinates which indicate a movement amount in a height direction as well as ofθcoordinates which indicate an angle of rotation inside the horizontal plane and ofϕcoordinates which indicate an angle of rotation from the horizontal plane are used. On the basis of a first designated measuring point and of a second designated measuring point and on the basis of the number of points in the X-direction and the Y- direction, the driving-system coordinates of other measuring points are set.</p>
申请公布号 JPH1172448(A) 申请公布日期 1999.03.16
申请号 JP19970232308 申请日期 1997.08.28
申请人 RIGAKU IND CO 发明人 NISHIMURA TAKASHI;YAMAMOTO ETSUHISA;YAGI KEISUKE
分类号 G01N23/223;G21K1/06;(IPC1-7):G01N23/223 主分类号 G01N23/223
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