发明名称 METHOD AND DEVICE OF X-RAY MEASUREMENT
摘要 <p>PROBLEM TO BE SOLVED: To make X-ray measurement performable with one kind of crystal monochromatic meter by selectively using one of a concentration method and a parallel beam method. SOLUTION: In the X-ray measurement method for analyzing a semple by using X-rays R, a curved crystal monochrometer is disposed in a lateral arrangement (a) in which the curve center axis X4 of a curved crystal monochrometer 18 is oriented substantially perpendicularly to an X-ray traveling path when used as a concentration optical system, and disposed in a longitudinal arrangement (b) in which the curve center axis X4 of the curve crystal monochrometer 18 is oriented substantially parallel with the X-ray traveling path when used as a parallel beam optical system. Even in the parallel beam method, the curved crystal monochrometer can be used.</p>
申请公布号 JPH1172595(A) 申请公布日期 1999.03.16
申请号 JP19970249841 申请日期 1997.08.29
申请人 RIGAKU CORP 发明人 SHIMIZU KATSUHIKO;AKUTSU OSAMU
分类号 G01N23/20;G21K1/06;(IPC1-7):G21K1/06 主分类号 G01N23/20
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