MEASURING APPARATUS FOR FLATNESS OF IC LEAD,申请号JP19970231625-传众专利搜索

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发明名称	MEASURING APPARATUS FOR FLATNESS OF IC LEAD
摘要
申请公布号	JPH1172316(A)	申请公布日期	1999.03.16
申请号	JP19970231625	申请日期	1997.08.28
申请人	M C ELECTRON KK	发明人	SHIMIZU RYOICHI
分类号	G01B11/30;H01L21/60;H01L21/66;H01L23/12;(IPC1-7):G01B11/30	主分类号	G01B11/30
代理机构		代理人
主权项
地址

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