发明名称 |
Power semiconductor device has a semi-insulating polysilicon layer |
摘要 |
A power semiconductor device has an insulation layer, which is formed on the substrate between a conductive region and an insulating channel-stop region, and a semi-insulating polysilicon (SIPOS) layer which covers the insulation layer while leaving parts of the conductive and channel-stop regions exposed. A power semiconductor device has a base region formed within a collector region in a semiconductor substrate, an emitter region formed within the base region, a channel-stop region isolated by a preset distance from the base region, an insulation layer formed on the substrate between the base region and the channel-stop region, a SIPOS layer covering the insulation layer while leaving parts of the base, emitter and channel-stop regions exposed, and base, emitter and equipotential electrodes respectively contacting the base, emitter and channel-stop regions. An Independent claim is also included for a power semiconductor device which has an anode region formed within a cathode region in a semiconductor substrate, a channel-stop region isolated by a preset distance from the anode region, an insulation layer formed on the substrate between the anode region and the channel-stop region, a SIPOS layer covering the insulation layer while leaving parts of the anode and channel-stop regions exposed, and anode and equipotential electrodes respectively contacting the anode and channel-stop regions.
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申请公布号 |
DE19836283(A1) |
申请公布日期 |
1999.03.11 |
申请号 |
DE19981036283 |
申请日期 |
1998.08.11 |
申请人 |
SAMSUNG ELECTRONICS CO. LTD., SUWON, KYUNGKI, KR |
发明人 |
PARK, CHAN-HO, INCHEON, KR;PARK, JAE-HONG, KYUNGKI, KR |
分类号 |
H01L29/73;H01L21/331;H01L29/06;H01L29/40;H01L29/732;(IPC1-7):H01L29/732 |
主分类号 |
H01L29/73 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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