发明名称 DRY ETCHING METHOD
摘要 In order to reduce a difference in denseness between the patterns in the etching of an aluminum-base wiring layer, a gas capable of generating a hydrogen atom upon plasma discharge is mixed in apredetermined proportion into chlorine gas and boron trichloride gas.
申请公布号 WO9912195(A1) 申请公布日期 1999.03.11
申请号 WO1997JP03006 申请日期 1997.08.28
申请人 HITACHI, LTD.;OMOTO, YUTAKA;MITZUTANI, TATSUMI;HAMASAKI, RYOJI;YOSHIDA, TSUYOSHI;KOJIMA, MASAYUKI 发明人 OMOTO, YUTAKA;MITZUTANI, TATSUMI;HAMASAKI, RYOJI;YOSHIDA, TSUYOSHI;KOJIMA, MASAYUKI
分类号 C23F4/00;H01L21/3213;(IPC1-7):H01L21/306;H01L21/321 主分类号 C23F4/00
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