发明名称 Method of manufacturing a semiconductor device comprising a titanium silicide layer
摘要 <p>A method of manufacturing a semiconductor device having a titanium silicide layer comprises the steps of forming a silicon layer (106) on a titanium layer (104), washing a surface of the silicon layer (106), and heat treating the titanium layer (104) after washing to make the titanium layer a titanium silicide (105). <IMAGE></p>
申请公布号 EP0600505(B1) 申请公布日期 1999.03.10
申请号 EP19930119526 申请日期 1993.12.03
申请人 CANON KABUSHIKI KAISHA 发明人 ASABA, TETSUO
分类号 H01L21/205;H01L21/28;H01L21/283;H01L21/3205;H01L21/336;H01L23/52;H01L29/78;(IPC1-7):H01L21/320 主分类号 H01L21/205
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