发明名称 METHOD FOR PRODUCTION OF SEMICONDUCTOR PHOTODETECTOR FROM SINGLE-CRYSTAL SILICON
摘要 FIELD: renewable power sources. SUBSTANCE: before baking chips with p+-n-n+ structure method involves orientation in same crystal axis and separation of n+ region from aluminum layer by foil-shaped silumin layer or silumin layer produced by vacuum deposition in vacuum oven; silicon content is within range of 10-30 %, depth is within range of 10-30 mcm. Baking is achieved in vacuum oven under pressure using temperature 650-750 C. Chip is heated up to this temperature for 15-30 min, kept for 5-10 min and cooled with temperature gradient of about 40-80 C per hour. EFFECT: elimination of aluminum compensation in n+ region, improved alloy junction, increased mechanical strength and temperature resistance.
申请公布号 RU2127471(C1) 申请公布日期 1999.03.10
申请号 RU19960106185 申请日期 1996.03.28
申请人 VSEROSSIJSKIJ NAUCHNO-ISSLEDOVATEL'SKIJ INSTITUT E 发明人 SIMAKIN V.V.;STREBKOV D.S.;TJUKHOV I.I.
分类号 H01L31/18 主分类号 H01L31/18
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