发明名称 METHOD AND DEVICE FOR CHECKING UNEVENNESS
摘要 PROBLEM TO BE SOLVED: To automatically check unevenness fault. SOLUTION: A computer 12 of an unevenness checking device 10 is provided with an A/D conversion module 13 which performs A/D conversion of an image signal from an image pickup device 11 that picks up the image of a display screen which is a surface 2 to be checked of LCD(liquid crystal display) 1, an image compression module 14, a flattening module 15 which flattens a curve that is constituted of luminance value of each pixel by a spline function, a noise eliminating module 16 which eliminates noise of a flattened curve, an emphasizing module 17 which emphasizes an unevenness fault part of a curve that is performed noise elimination and a fault deciding module 18 which sets threshold to an emphasized curve and decides an unevenness fault. Since check precision and the manufacturing yield of LCD can be improved and unevenness faults of various sizes can detected by operation processing at one time by automating LCD unevenness checking and ignoring human visual checking, it is possible to reduce check time.
申请公布号 JPH1166311(A) 申请公布日期 1999.03.09
申请号 JP19970227550 申请日期 1997.08.08
申请人 HITACHI TOBU SEMICONDUCTOR LTD;TOKYO DENKI UNIV 发明人 WATABE NORIO;ICHINO MANABU;YAGUCHI HIROYUKI
分类号 G01N21/88;G01N21/93;G06T1/00;G06T7/00;G09G3/36;H01L21/66 主分类号 G01N21/88
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