Method and circuit for checking multilevel programming of floating-gate nonvolatile memory cells particularly flash cells

摘要

To check the programming of a nonvolatile memory cell storing an actual threshold value, the drain terminal of the cell is biased at a constant voltage; the gate terminal is biased at a check voltage; the cell is supplied with a predetermined current to determine a gate-source voltage drop related to the actual threshold value; and the voltage at the source terminal is supplied to an input of an operational amplifier. In an open-loop configuration, the desired threshold value of the set predetermined current is supplied as the check voltage; the amplifier compares the source voltage with the ground; and switching of the amplifier indicates the desired threshold value has been reached. In a closed-loop configuration, the output of the operational amplifier is connected directly to the gate terminal of the cell, and supplies the desired threshold value directly.