发明名称 PROCESSING APPARATUS
摘要 <p>PROBLEM TO BE SOLVED: To provide a processing apparatus which can realize simultaneous processing of the front and back surfaces of a substrate and can especially homogeneously process the back surface of the board. SOLUTION: A processing apparatus 13 includes a spin chuck 20 for rotatably holding a wafer W, a nozzle 24 for subjecting the wafer W held in the chuck 20 to surface treatment, a front-surface scrub cleaning device 25, a nozzle 30 for processing the back surface of the wafer W held in the chuck 20, and a back-surface scrub cleaning device 31. In the apparatus, a rotary shaft 27 of the chuck 20 is made hollow, and the back-surface processing nozzle 30 and scrub cleaning device 31 are disposed within the hollow space.</p>
申请公布号 JPH1167705(A) 申请公布日期 1999.03.09
申请号 JP19970236531 申请日期 1997.08.18
申请人 TOKYO ELECTRON LTD 发明人 NAKAJIMA SATOSHI;MIYAZAKI TAKANORI;TANIYAMA HIROMI
分类号 B08B3/02;H01L21/304;H01L21/68;H01L21/683;(IPC1-7):H01L21/304 主分类号 B08B3/02
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