发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURE THEREOF
摘要 PROBLEM TO BE SOLVED: To realize reduction in size and cost of an entire device and also increase operation reliability. SOLUTION: On a circuit chip 10 having a sensor output processing circuit, bump electrodes 11 and rectangular frame-shaped sealing bumps 12 are located so as to surround the bump electrodes 11 formed from Sn-Pb solder. On a sensor chip 1 having a sensing section 5 including a beam structure, electrode pads 8 to be thermocompression-bonded to the bump electrodes 11 and pads 9 for junction to be thermocompression-bonded to the sealing bumps 12 are formed. With the sensor chip 1 being face-down bonded onto the circuit chip 10, there is an airtight space 13 formed by sealing the sensing section 5 by sealing the bumps 12.
申请公布号 JPH1167820(A) 申请公布日期 1999.03.09
申请号 JP19970214574 申请日期 1997.08.08
申请人 DENSO CORP 发明人 YOSHIHARA SHINJI;AKITA SHIGEYUKI
分类号 H01L21/60;H01L23/10;H01L25/065;H01L25/07;H01L25/18 主分类号 H01L21/60
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