发明名称 ABNORMALITY DETECTION CIRCUIT FOR MICROCOMPUTER
摘要 PROBLEM TO BE SOLVED: To provide an abnormality detection circuit for microcomputer(MC) with which the abnormality of plural MC can be effectively detected in a little hardware configuration without damaging reliability. SOLUTION: 1st and 2nd MC 1a and 1b consisting of an MC system are provided, and the 1st and 2nd MC 1a and 1b are equipped with abnormality detecting means for detecting the abnormality of the other MC based on output signals Gb and Ga of the other MC. The abnormality detecting means has a monitor timer means to be operated for 1st prescribed time for monitoring the state of the output signal from the other MC, plural processing means to be executed when a state change such as interruption occurs, and the background loop to be executed when no state change occurs. Then, the state of the output signal from the other MC is monitored and when the state change of the other MC does not occur within the 1st prescribed time, abnormality detecting processing is executed by the background loop.
申请公布号 JPH1166020(A) 申请公布日期 1999.03.09
申请号 JP19970224899 申请日期 1997.08.21
申请人 MITSUBISHI ELECTRIC CORP 发明人 IKEDA KATSUMI
分类号 G06F15/16;G06F11/22;G06F15/177 主分类号 G06F15/16
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