发明名称 SiC/111-V-nitride heterostructures on SiC/SiO2/Si for optoelectronic devices
摘要 A low-cost Si-based construction for optical and electronic bulk-heterostructure devices and multiple-quantum-well devices in which the active layers of the device are SiC or AlGaN or InGaN or InAlN. Material quality is high, and the MQW devices such as blue light lasers or LEDs have stable pseudomorphic layers with low defect densities. The low-cost large-area 3C SiC substrate is created by converting 100% of a 100-500 angstrom ( ANGSTROM ) layer of Si in a silicon-on-insulator wafer to 3C SiC with propane at 1300 degrees C. The SiO2 layer provides strain-free support for the "perfect" 3C SiC crystal layer. Direct-gap wurtzite nitride heterostructures, bulk or pseudomorphic MQW, are grown upon an (0001) 6H SiC epilayer on the (111) 3C SIC substrate, or directly upon the (111) 3C SiC substrate. For zincblende heterostructures, a (100) 3C SiC substrate is used.
申请公布号 US5880491(A) 申请公布日期 1999.03.09
申请号 US19970791341 申请日期 1997.01.31
申请人 THE UNITED STATES OF AMERICA AS REPRESENTED BY THE SECRETARY OF THE AIR FORCE 发明人 SOREF, RICHARD A.;NAMAVAR, FEREYDOON
分类号 H01L33/00;H01L33/04;(IPC1-7):H01L29/15;H01L31/101 主分类号 H01L33/00
代理机构 代理人
主权项
地址