发明名称 METHOD OF MANUFACTURING N-TYPE OF P-TYPE METALLIC SILICON HAVING LOW RESISTIVITY
摘要 PROBLEM TO BE SOLVED: To provide a silicon crystal which is doped in high concentration. SOLUTION: An element X having a large ion diameter and an element Y, having a small ion diameter in comparison with silicon, are added to the atmosphere for growing a silicon single crystal at a ratio of X:Y=1:(1+α) or X:Y=(1+α):1, (1<=α<=5) for doping the silicon crystal to a high concentration of 10<20> to 10<22> cm<-3> . This method is performed in a pull-up growth method, an epitaxial growth method, or a selective diffusion method. This method can greatly improve the carrier concentration by simultaneous doping and produce a metallic silicon having a resistivity which is usable for wiring.
申请公布号 JPH1167768(A) 申请公布日期 1999.03.09
申请号 JP19970223304 申请日期 1997.08.20
申请人 RES DEV CORP OF JAPAN 发明人 YOSHIDA HIROSHI
分类号 C30B29/06;C30B15/00;C30B23/02;C30B25/02;C30B31/00;H01L21/02;H01L21/203;H01L21/208;H01L21/28;H01L21/3205;H01L23/52;H01L29/167;(IPC1-7):H01L21/320 主分类号 C30B29/06
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