发明名称 SCANNING PROBE MICROSCOPE
摘要 PROBLEM TO BE SOLVED: To provide a scanning probe microscope in which the resonance vibration of a probe driving system caused by probe scanning is promptly attenuated. SOLUTION: An arbor part 3 surrounded by a ring-shaped groove 5 is formed at the center part of a permanent magnet 2. A cap-shaped needle 4 is freely fitted to the arbor part 3, and a voice coil 6 is wound around the outer peripheral part of the needle 4. The inside of the ring-shaped groove 5 is filled with a viscous fluid 7, and the permanent magnet 2, the arbor part 3, the needle 4, and the voice coil 6 form a voice coil motor. One end of a spindle 8 is fixed to the center part of the blocked end 4a of the needle 4, and the free end of a cantilever 14 is fixed to the other end of the spindle 8. The cantilever 10b of a probe 10 is fixed to the cantilever 14 via a supporting base 12,. and a probe 10a is formed at the free end of the cantilever 10b.
申请公布号 JPH1164346(A) 申请公布日期 1999.03.05
申请号 JP19970216322 申请日期 1997.08.11
申请人 SEIKO INSTR INC 发明人 UMEKI TAKESHI;SATO YORIHIRO;YASUTAKE MASATOSHI
分类号 G01B21/30;G01N37/00;G01Q10/02;G01Q10/04;G01Q90/00;(IPC1-7):G01N37/00 主分类号 G01B21/30
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