| 摘要 |
<p>A thin film photoelectric transducer includes a polycrystalline photoelectric transducing layer (4) and a metal thin film (3) which covers one of the major surfaces of the polycrystalline photoelectric transducing layer (4). The polycrystalline photoelectric transducing layer (4) has an average thickness within a range of 0.5 - 20 νm. At least one of the major surfaces of the polycrystalline photoelectric transducing layer (4) has a surface texture structure, which has minute unevenness whose level difference is smaller than half of the thickness of the polycrystalline photoelectric transducing layer (4) and substantially within a range of 0.05 - 3 νm.</p> |
