发明名称 Trench lateral overflow drain antiblooming structure for virtual phase charge coupled devices with virtual gate element
摘要 The lateral overflow drain for charge coupled devices includes: a semiconductor region 70 of a first conductivity type having a trench 92; a drain region 24 of a second conductivity type below the trench 92; a gate 20 in the trench 92 overlying and separated from a portion of the semiconductor region 70; and a virtual gate 30 of the first conductivity type in the semiconductor region 70 adjacent the trench 92.
申请公布号 US5877520(A) 申请公布日期 1999.03.02
申请号 US19970916018 申请日期 1997.08.21
申请人 TEXAS INSTRUMENTS INCORPORATED 发明人 HYNECEK, JAROSLAV
分类号 H01L27/148;(IPC1-7):H01L27/108 主分类号 H01L27/148
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