发明名称 |
Method of cutting semiconductor ingots and apparatus for cutting thereof |
摘要 |
The present invention proposes a method for cutting semiconductor ingots into sliced wafers by use of wire saws, so that the cut-out surface shape of wafers can be easily controlled by utilizing a wire-saw cutting device. The workpiece holding plate 21 is disposed in such a way that it can move along the longitudinal axis Y of the semiconductor ingot 3. The semiconductor ingot 3 is moved downward to facilitate the cutting operation by wire saw. Accordingly, the displacement along the longitudinal axis Y is made to change in response to the variation along the location of the semiconductor ingot 3.
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申请公布号 |
US5875770(A) |
申请公布日期 |
1999.03.02 |
申请号 |
US19970903725 |
申请日期 |
1997.07.31 |
申请人 |
KOMATSU ELECTRONIC METALS CO., LTD. |
发明人 |
FUKUNAGA, HISAYA |
分类号 |
B23D59/00;B28D5/00;B28D5/04;(IPC1-7):B28D1/08 |
主分类号 |
B23D59/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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