发明名称 Method of cutting semiconductor ingots and apparatus for cutting thereof
摘要 The present invention proposes a method for cutting semiconductor ingots into sliced wafers by use of wire saws, so that the cut-out surface shape of wafers can be easily controlled by utilizing a wire-saw cutting device. The workpiece holding plate 21 is disposed in such a way that it can move along the longitudinal axis Y of the semiconductor ingot 3. The semiconductor ingot 3 is moved downward to facilitate the cutting operation by wire saw. Accordingly, the displacement along the longitudinal axis Y is made to change in response to the variation along the location of the semiconductor ingot 3.
申请公布号 US5875770(A) 申请公布日期 1999.03.02
申请号 US19970903725 申请日期 1997.07.31
申请人 KOMATSU ELECTRONIC METALS CO., LTD. 发明人 FUKUNAGA, HISAYA
分类号 B23D59/00;B28D5/00;B28D5/04;(IPC1-7):B28D1/08 主分类号 B23D59/00
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