发明名称 PROCEDIMENTO DI METALLIZZAZIONE MULTILIVELLO AD ALTA PLANARIZZAZIONE PER DISPOSITIVI A SEMICONDUTTORE
摘要 <p>Subject-matter of this invention is a method of high planarization multi-level metallization for semiconductor devices in which, starting from a first layer of planarized dielectric material, the interconnection of each level are embedded within a layer of dielectric material. <IMAGE></p>
申请公布号 IT1293536(B1) 申请公布日期 1999.03.01
申请号 IT1997RM00431 申请日期 1997.07.14
申请人 CONSORZIO EAGLE 发明人 RUSSO FELICE;MICCOLI GIUSEPPE;NARDI NATALE;RICOTTI MARCO;FRANCHINA ALFREDO
分类号 H01L21/3205;H01L21/768;H01L23/532 主分类号 H01L21/3205
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