发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURE THEREOF
摘要 <p>PROBLEM TO BE SOLVED: To provide a nonvolatile memory device, capable of operating at high temperatures and maintaining desired durability and data-storing performance. SOLUTION: An integrated circuit 10 is formed on a semiconductor substrate 20. A nonvolatile memory device 12 and a semiconductor device 11 are included in the circuit 10. The device 12 includes a dielectric layer 15 having a nitride compound. Further, the device 12 includes a silicon dioxide layer 33, but the layer 33 is also used to from a part of the device 11.</p>
申请公布号 JPH1154640(A) 申请公布日期 1999.02.26
申请号 JP19980202728 申请日期 1998.07.02
申请人 MOTOROLA INC 发明人 DAHL PHILLIP WARREN;MAKWANA JITENDRA JAYANTILAL;ZHOU ZHIXU
分类号 G11C16/04;H01L21/8247;H01L27/115;H01L29/788;H01L29/792;(IPC1-7):H01L21/824 主分类号 G11C16/04
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