| 摘要 |
A circuit board arrangement for testing a test circuit (1). The circuit arrangement includes a single circuit board, a data acquisition device (4) and the power supply device (5). The data acquisition device and the power supply device are disposed on the single circuit board. The single circuit board is coupled to the test circuit so that the data acquisition device (4) can receive test output signals from the test circuit. The power supply provides power to the test circuit.
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