发明名称 |
Internal/external clock option for built-in self test |
摘要 |
An internal/external clock option for built in self test is provided. In one embodiment of the present invention, a clock selection circuit (150) is provided. The clock selection circuit (150) comprises an external clock source (152) and an internal clock source (177). A first multiplexer (164) is provided and has the external clock source (152) and the internal clock source (177) as data inputs and an internal clock selection bit value (B-CLKMUXB 176) as a data select input. A second multiplexer (156) having the external clock (152) and the output of the first multiplexer as data inputs and a data select input (BCLK-EN) based on whether a self-test mode is activated (BIST-EN) and the internal clock selection bit value (B-CLKMUXB) is also provided. The external clock source (152) or internal clock source (177) is selected based on the value of the internal clock selection bit value (B-CLKMUXB 176) and whether the self test mode is activated (BIST-EN). |
申请公布号 |
US5875153(A) |
申请公布日期 |
1999.02.23 |
申请号 |
US19980004998 |
申请日期 |
1998.01.09 |
申请人 |
TEXAS INSTRUMENTS INCORPORATED |
发明人 |
HII, KUONG HUA;POWELL, THEO J.;CLINE, DANNY R. |
分类号 |
G01R31/30;G06F1/08;G06F11/273;G11C5/14;G11C29/10;G11C29/14;G11C29/36;G11C29/38;G11C29/44;G11C29/50;(IPC1-7):G06F11/26 |
主分类号 |
G01R31/30 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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