| 摘要 |
<p>A method and system for routing a digital probe (fig.4) which signals either a triggered or non-triggered state (58) to continuously scan part surface without having to return to a rest position. The probe is carried by manufacturing equipment capable of moving in response to control signals (54) and providing manufacturing equipment feedback signals (56) indicating the current position of the probe. Continuous movement of the digital probe is achieved by testing the probe to determine if it is trigged or not at spaced time intervals (58), and rotating a move vector (60 or 64) in each computation cycle to alter the probe trajectory as a function of the operating state of the probe and its position during the previous computation cycle. Various computation algorithms for altering the move vector (60 or 64) are possible, including increasing or decreasing one component of the move vector (60 or 64) by a constant value depending on whether the probe is triggered or not (58).</p> |
