Integrated circuit with test mode for monitoring internal voltage

摘要

The circuit has at least one reference voltage generator (RFG) and an internal voltage generator (VDC) for setting a voltage level on an internal voltage supply line (IVL) depending on a comparison with the reference voltage. A driver (2) receives the reference voltage and generates a voltage at essentially the same level for transfer to a connecting surface (1) in response to a test mode signal.