| 摘要 |
PROBLEM TO BE SOLVED: To efficiently carry out the actual performance test of an integrated circuit to be measured in a short time without causing the complication of a test process and increasing a test cost in a semiconductor integrated circuit and its test method for carrying out a performance test at the actual working frequency of an integrated circuit to be measured with an integrated circuit tester having ordinary performance. SOLUTION: A test device has a measured integrated circuit 1; a signal frequency gradually doubling section 6 for increasing the frequency of reference input signal inputted into the measured integrated circuit together with a plurality of testing signals as much as fixed multiple; and a reference input signal synchronizing section 5 for synchronizing a gradual doubled output signal outputted from the section 6 with the reference input signal, and at least a part of the circuit element of a PLL circuit to compose the signal frequency gradually doubling section 6 or a reference input signal synchronizing section 5 will be included in the measured integrated circuit 1. |
