发明名称 |
CMOS-Schaltung und Verfahren zu ihrer Herstellung |
摘要 |
The invention relates to an integrated CMOS circuit, comprising a silicon substrate (1), a dielectric layer, an additional silicon layer (2) and MOS transistors having a source, a gate with gate dielectric (3b) and a drain. The gate dielectric (3b) contains nitrogen or a nitrogen compound. The nitrogen and/or the nitrogen compound prevents lateral oxidation between the silicon layers (1, 2) in the edge areas of the gate dielectric (3b).
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申请公布号 |
DE19731203(A1) |
申请公布日期 |
1999.02.11 |
申请号 |
DE19971031203 |
申请日期 |
1997.07.21 |
申请人 |
SIEMENS AG, 80333 MUENCHEN, DE |
发明人 |
SCHWALKE, UDO, DR., 84431 HELDENSTEIN, DE;KERBER, MARTIN, DR., 81827 MUENCHEN, DE |
分类号 |
H01L21/28;H01L21/8238;H01L27/092;H01L29/51;(IPC1-7):H01L27/092;H01L21/823 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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