发明名称 CMOS-Schaltung und Verfahren zu ihrer Herstellung
摘要 The invention relates to an integrated CMOS circuit, comprising a silicon substrate (1), a dielectric layer, an additional silicon layer (2) and MOS transistors having a source, a gate with gate dielectric (3b) and a drain. The gate dielectric (3b) contains nitrogen or a nitrogen compound. The nitrogen and/or the nitrogen compound prevents lateral oxidation between the silicon layers (1, 2) in the edge areas of the gate dielectric (3b).
申请公布号 DE19731203(A1) 申请公布日期 1999.02.11
申请号 DE19971031203 申请日期 1997.07.21
申请人 SIEMENS AG, 80333 MUENCHEN, DE 发明人 SCHWALKE, UDO, DR., 84431 HELDENSTEIN, DE;KERBER, MARTIN, DR., 81827 MUENCHEN, DE
分类号 H01L21/28;H01L21/8238;H01L27/092;H01L29/51;(IPC1-7):H01L27/092;H01L21/823 主分类号 H01L21/28
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