发明名称 Structure and process for reducing the on-resistance of mos-gated power devices
摘要 A VDMOS structure with an added n- doping component, and a LOCOS oxide self-aligned to it, at the surface extension of the drain. The additional shallow n- component permits the body diffusion to be heavier, and hence reduces the risk of latchup.
申请公布号 US5869371(A) 申请公布日期 1999.02.09
申请号 US19950552383 申请日期 1995.11.03
申请人 STMICROELECTRONICS, INC. 发明人 BLANCHARD, RICHARD A.
分类号 H01L21/336;H01L29/08;H01L29/423;H01L29/78;(IPC1-7):H01L21/336 主分类号 H01L21/336
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